Peter Schattschneider completed his diploma degree in Physics in 1973 at the Vienna University of Technology, with a thesis entitled X-ray diffusion profiles in thin layers (). In 1976 he successfully defended at the same university his PhD thesis on The determination of lattice constants of binary alloys from X-ray diffraction profiles (). From 1974 to 1977 he was also enrolled at the University of Vienna where he obtained a mag. rer. nat. degree in the college teaching of Physics and Mathematics. After working for a few years on air- and spaceborn sensors in a private engineering enterprise, he returned to his alma mater in 1980 as assistant in the Institute for Applied and Technical Physics, where he became Assistant Professor in 1988.
