In built-in self-test (BIST) techniques, storing all the circuit outputs on chip is not possible, but the circuit output can be compressed to form a signature that will later be compared to the golden signature (of the good circuit) to detect faults. Since this compression is lossy, there is always a possibility that a faulty output also generates the same signature as the golden signature and the faults cannot be detected. This condition is called error masking or aliasing. BIST is accomplished with a multiple-input signature register (MISR or MSR), which is a type of LFSR. A standard LFSR has a single XOR or XNOR gate, where the input of the gate is connected to several "taps" and the output is connected to the input of the first flip-flop. A MISR has the same structure, but the input to every flip-flop is fed through an XOR/XNOR gate. For example, a 4-bit MISR has a 4-bit parallel output and a 4-bit parallel input. The input of the first flip-flop is XOR/XNORd with parallel input bit zero and the "taps". Every other flip-flop input is XOR/XNORd with the preceding flip-flop output and the corresponding parallel input bit. Consequently, the next state of the MISR depends on the last several states opposed to just the current state. Therefore, a MISR will always generate the same golden signature given that the input sequence is the same every time.
