Tirohia te wāhanga i raro nei, kātahi ka whakautu i te pātai i muri mai i te reo kotahi me te wāhanga:  Passage: Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. Ko te āta tirotiro i te ngota ngota ngota (AFM) he momo tino-teitei o te āta tirotiro i te ngota ngota (SPM), me te whakatau i runga i te raupapa o nga hautanga o te nanometer, neke atu i te 1000 nga wa pai ake i te rohe whakaheke whatu.  Pātai: He aha te AFM?
he momo miihini miihini matawai matawai tino-nui