ce</em> instead of on the paraxial
ray trace based upon simple algebraic relationships. This
so-called <em>generalized paraxial ray trace</em> is based upon a
finite difference, differential ray trace along the chief ray and it
accounts for all optical system parameters including tilts and
decenters. For centered systems, the results of this "generalized
paraxial ray trace" agree exactly with the conventional paraxial
trace. There are many more types of aberration analysis available than
can be described he