fn-bracket">]</span></span>
<p>K. Iakoubovskii, K. Mitsuishi, Y. Nakayama, and K. Furuya. Thickness measurements with electron energy loss spectroscopy. <em>Microscopy Research and Technique</em>, 71(8):626–631, 2008. <a class="reference external" href="https://doi.org/https://doi.org/10.1002/jemt.20597">doi:https://doi.org/10.1002/jemt.20597</a>.</p>
</div>
<div class="citation" id="id16" role="doc-biblioentry">
<span class="label"><span class="fn-bracket">[</span>24<span class="fn-bracket">]</span><