  Fourier ptychography microscopy (FPM), sharing its roots with synthetic
aperture technique and phase retrieval method, is a recently developed
computational microscopic super-resolution technique. By turning on the
light-emitting diode (LED) elements sequentially and acquiring the
corresponding images that contain different spatial frequencies, FPM can
achieve a wide field-of-view (FOV), high-spatial-resolution imaging, and phase
recovery simultaneously. Conventional FPM assumes that the sample is
sufficiently thin and strictly in focus. Nevertheless, even for a relatively
thin sample, the non-planar distribution characteristics and the non-ideal
position/posture of the sample will cause all or part of FOV to be defocused.
In this paper, we proposed a fast digital refocusing and depth-of-field (DOF)
extended FPM strategy by taking the advantages of image lateral shift caused by
sample defocusing and varied-angle illuminations. The lateral shift amount is
proportional to the defocus distance and the tangent of the illumination angle.
Instead of searching the optimal defocus distance in optimization strategy,
which is time-consuming, the defocus distance of each subregion of the sample
can be precisely and quickly obtained by calculating the relative lateral shift
amounts corresponding to different oblique illuminations. And then, the digital
refocusing strategy rooting in the Fresnel propagator is integrated into the
FPM framework to achieve the high-resolution and phase information
reconstruction for each part of the sample, which means the DOF the FPM is
effectively extended. The feasibility of the proposed method in fast digital
refocusing and FOV extending is verified in the actual experiments with the
USAF chart and biological samples.
