  Raman microscopy is one of the methods that could be used for future
post-mortem analyses of samples extracted from ITER plasma facing. This study
shows that this technique is useful for studying tungsten-based materials
containing impurities including oxides and nitrides. Here, we apply pulsed
laser deposition and DC argon glow discharges to produce tungsten-containing
synthetic films (compact, porous) and nanoparticles and investigate the
influence of their morphology on the measured Raman spectra. The amounts of
oxygen and/or nitrogen in the films are also investigated. Comparative data are
obtained by X-ray Photoelectrons Spectroscopy, Atomic Force Microscopy,
Electron Microscopies (Scanning and Transmission), Energy Dispersive X-ray
spectroscopy, Time-of-Flight Elastic Recoil Detection Analysis. The power
density of the laser beam used to perform Raman microscopy is varied by up to 4
orders of magnitude (0.01-20 mW/$\mu$m 2) to investigate thermal stability of
films and nanoparticles. As a first result, we give evidence that Raman
microscopy is sensitive enough to detect surface native oxides. Secondly, more
tungsten oxides are detected in porous materials and nanoparticles than in
compact films, and the intensities of the Raman band correlate to their oxygen
content. Thirdly, thermal stability of these films (i.e. structural and
chemical modification under laser heating) is poor when compact films contain a
sufficiently large amount of nitrogen. This finding suggests that nitrogen can
be substituted by oxygen during Raman laser induced heating occurring in
ambient air. Finally, our methodology can be used to rapidly characterize
morphology and chemistry of the samples analyzed, and also to create oxides at
the micrometer scale. keywords: PLD, Raman spectroscopy, tungsten oxide,
tungsten nitride, plasma wall interaction, laser heating, post-mortem analysis
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