  The in situ synchrotron high-energy X-ray powder diffraction (XRD) technique
is highly utilized by researchers to analyze the crystallographic structures of
materials in functional devices (e.g., battery materials) or in complex sample
environments (e.g., diamond anvil cells or syntheses reactors). An atomic
structure of a material can be identified by its diffraction pattern, along
with detailed analysis such as Rietveld refinement which indicates how the
measured structure deviates from the ideal structure (e.g., internal stresses
or defects). For in situ experiments, a series of XRD images is usually
collected on the same sample at different conditions (e.g., adiabatic
conditions), yielding different states of matter, or simply collected
continuously as a function of time to track the change of a sample over a
chemical or physical process. In situ experiments are usually performed with
area detectors, collecting 2D images composed of diffraction rings for ideal
powders. Depending on the material's form, one may observe different
characteristics other than the typical Debye Scherrer rings for a realistic
sample and its environments, such as textures or preferred orientations and
single crystal diffraction spots in the 2D XRD image. In this work, we present
an investigation of machine learning methods for fast and reliable
identification and separation of the single crystal diffraction spots in XRD
images. The exclusion of artifacts during an XRD image integration process
allows a precise analysis of the powder diffraction rings of interest. We
observe that the gradient boosting method can consistently produce high
accuracy results when it is trained with small subsets of highly diverse
datasets. The method dramatically decreases the amount of time spent on
identifying and separating single crystal spots in comparison to the
conventional method.
