  Identifying parameters of computational models from experimental data, or
model calibration, is fundamental for assessing and improving the
predictability and reliability of computer simulations. In this work, we
propose a method for Bayesian calibration of models that predict morphological
patterns of diblock copolymer (Di-BCP) thin film self-assembly while accounting
for various sources of uncertainties in pattern formation and data acquisition.
This method extracts the azimuthally-averaged power spectrum (AAPS) of the
top-down microscopy characterization of Di-BCP thin film patterns as summary
statistics for Bayesian inference of model parameters via the pseudo-marginal
method. We derive the analytical and approximate form of a conditional
likelihood for the AAPS of image data. We demonstrate that AAPS-based image
data reduction retains the mutual information, particularly on important length
scales, between image data and model parameters while being relatively agnostic
to the aleatoric uncertainties associated with the random long-range disorder
of Di-BCP patterns. Additionally, we propose a phase-informed prior
distribution for Bayesian model calibration. Furthermore, reducing image data
to AAPS enables us to efficiently build surrogate models to accelerate the
proposed Bayesian model calibration procedure. We present the formulation and
training of two multi-layer perceptrons for approximating the
parameter-to-spectrum map, which enables fast integrated likelihood
evaluations. We validate the proposed Bayesian model calibration method through
numerical examples, for which the neural network surrogate delivers a fivefold
reduction of the number of model simulations performed for a single calibration
task.
