  Many fabless semiconductor companies outsource their designs to third-party
fabrication houses. As trustworthiness of chain after outsourcing including
fabrication houses is not established, any adversary in between, with malicious
intent may tamper the design by inserting Hardware Trojans (HTs). Detection of
such HTs is of utmost importance to assure the trust and integrity of the
chips. However, the efficiency of detection techniques based on side-channel
analysis is largely affected by process variations. In this paper, a
methodology for detecting HTs by analyzing the delays of topologically
symmetric paths is proposed. The proposed technique, rather than depending on
golden ICs as a reference for HT detection, employs the concept of
self-referencing. In this work, the fact that delays of topologically symmetric
paths in an IC will be affected similarly by process variations is exploited. A
procedure to chose topologically symmetric paths that are minimally affected by
process variations is presented. Further, a technique is proposed to create
topologically symmetric paths by inserting extra logic gates if such paths do
not exist in the design intrinsically. Simulations performed on ISCAS-85
benchmarks establish that the proposed method is able to achieve a true
positive rate of 100% with a false positive rate less than 3%. In our
experimentation, We have considered the maximum of 15% intra-die and 20%
inter-die variations in threshold voltage (Vth).
