  We consider the problem of characterizing the wavefront set of a tempered
distribution $u\in\mathcal{S}'(\mathbb{R}^{d})$ in terms of its continuous
wavelet transform, where the latter is defined with respect to a suitably
chosen dilation group $H\subset{\rm GL}(\mathbb{R}^{d})$. In this paper we
develop a comprehensive and unified approach that allows to establish
characterizations of the wavefront set in terms of rapid coefficient decay, for
a large variety of dilation groups.
  For this purpose, we introduce two technical conditions on the dual action of
the group $H$, called microlocal admissibilty and (weak) cone approximation
property. Essentially, microlocal admissibilty sets up a systematical
relationship between the scales in a wavelet dilated by $h\in H$ on one side,
and the matrix norm of $h$ on the other side. The (weak) cone approximation
property describes the ability of the wavelet system to adapt its
frequency-side localization to arbitrary frequency cones. Together, microlocal
admissibility and the weak cone approximation property allow the
characterization of points in the wavefront set using multiple wavelets.
Replacing the weak cone approximation by its stronger counterpart gives access
to single wavelet characterizations.
  We illustrate the scope of our results by discussing -- in any dimension
$d\ge2$ -- the similitude, diagonal and shearlet dilation groups, for which we
verify the pertinent conditions. As a result, similitude and diagonal groups
can be employed for multiple wavelet characterizations, whereas for the
shearlet groups a single wavelet suffices. In particular, the shearlet
characterization (previously only established for $d=2$) holds in arbitrary
dimensions.
