  We present a new Bayesian methodology to learn the unknown material density
of a given sample by inverting its two-dimensional images that are taken with a
Scanning Electron Microscope. An image results from a sequence of projections
of the convolution of the density function with the unknown microscopy
correction function that we also learn from the data. We invoke a novel design
of experiment, involving imaging at multiple values of the parameter that
controls the sub-surface depth from which information about the density
structure is carried, to result in the image. Real-life material density
functions are characterised by high density contrasts and typically are highly
discontinuous, implying that they exhibit correlation structures that do not
vary smoothly. In the absence of training data, modelling such correlation
structures of real material density functions is not possible. So we discretise
the material sample and treat values of the density function at chosen
locations inside it as independent and distribution-free parameters. Resolution
of the available image dictates the discretisation length of the model; three
models pertaining to distinct resolution classes are developed. We develop
priors on the material density, such that these priors adapt to the sparsity
inherent in the density function. The likelihood is defined in terms of the
distance between the convolution of the unknown functions and the image data.
The posterior probability density of the unknowns given the data is expressed
using the developed priors on the density and priors on the microscopy
correction function as elicitated from the Microscopy literature. We achieve
posterior samples using an adaptive Metropolis-within-Gibbs inference scheme.
The method is applied to learn the material density of a 3-D sample of a real
nano-structure and of simulated alloy samples.
