  This paper is concerned with the tight closure of an ideal $I$ in a
commutative Noetherian ring $R$ of prime characteristic $p$. The formal
definition requires, on the face of things, an infinite number of checks to
determine whether or not an element of $R$ belongs to the tight closure of $I$.
The situation in this respect is much improved by Hochster's and Huneke's test
elements for tight closure, which exist when $R$ is a reduced algebra of finite
type over an excellent local ring of characteristic $p$.
  More recently, Hochster and Huneke have introduced the concept of test
exponent for tight closure: existence of these test exponents would mean that
one would have to perform just one single check to determine whether or not an
element of $R$ belongs to the tight closure of $I$. However, to quote Hochster
and Huneke, 'it is not at all clear whether to expect test exponents to exist;
roughly speaking, test exponents exist if and only if tight closure commutes
with localization'.
  The main purpose of this paper is to provide a short direct proof that test
exponents exist for parameter ideals in a reduced excellent equidimensional
local ring of characteristic $p$.
