  Accurate direct measurements of far-field thermal infrared emission become
increasingly important because conventional methods, relying on indirect
assessments, such as reflectance/transmittance, are inaccurate or even
unfeasible to characterize state-of-art devices with novel spectra,
directionalities, and polarizations. The direct collection of the far-field
emission from these tiny devices is also challenging because of their shrinking
footprints and uncontrollable radiation noises from their surroundings. Here,
we demonstrate a microscopic lock-in FTIR system that realizes significant
improvement in signal-to-noise ratio (SNR) by combining a microscope and a
lock-in amplifier with an FTIR. The lock-in FTIR is ultrasensitive, with a
specific detectivity 10^6 times higher than commercial ones, to overcome the
optical loss and background noise during the emission light collection. Based
on an analytical model of the signal detection process, we also explore the
combination of modulated Joule heating and global heating to fulfill the
potential of our system for noise reduction. Our findings show that, compared
to previous studies, more than 3 times lower temperatures are sufficient to
generate a measurable signal. Under a heating temperature of around 125
{\deg}C, we can achieve an SNR of about 23.7, which is far above the
true-signal-threshold (SNR of about 3.0). Furthermore, the system can respond
fast enough (up to 175kHz) to record spectral-resolved dynamics of microdevices
in the frequency domain. The measurable frequency range can be extended up to
MHz or even GHz level by a high-speed circuit model. We believe the system
together with the analytical signal processing can be beneficial for
next-generation thermal infrared material and device exploration, boosting the
applications in lighting, sensing, imaging, and energy harvesting on a small
scale.
