  At submicron manufacturing technology nodes, pro- cess variations affect
circuit performance significantly. To counter these variations, engineers are
reserving more timing margin to maintain yield, leading to an unaffordable
overdesign. Most of these margins, however, are wasted after manufacturing,
because process variations cause only some chips to be really slow, while other
chips can easily meet given timing specifications. To reduce this pessimism, we
can reserve less timing margin and tune failed chips after manufacturing with
clock buffers to make them meet timing specifications. With this post-silicon
clock tuning, critical paths can be balanced with neighboring paths in each
chip specifically to counter the effect of process variations. Consequently,
chips with timing failures can be rescued and the yield can thus be improved.
This is specially useful in high- performance designs, e.g., high-end CPUs,
where clock binning makes chips with higher performance much more profitable.
In this paper, we propose a method to determine where to insert post-silicon
tuning buffers during the design phase to improve the overall profit with clock
binning. This method learns the buffer locations with a Sobol sequence
iteratively and reduces the buffer ranges afterwards with tuning concentration
and buffer grouping. Experimental results demonstrate that the proposed method
can achieve a profit improvement of about 14% on average and up to 26%, with
only a small number of tuning buffers inserted into the circuit.
