  Supply voltage scaling is one of the most effective techniques to reduce the
power consumption of microprocessors. However, technology limitations such as
aging and process variability enforce microprocessor designers to apply
pessimistic voltage guardbands to guarantee correct operation in the field for
any foreseeable workload. This worst-case design practice makes energy
efficiency hard to scale with technology evolution. Improving energy-efficiency
requires the identification of the chip design margins through time-consuming
and comprehensive characterization of its operational limits. Such a
characterization of state-of-the-art multi-core CPUs fabricated in aggressive
technologies is a multi-parameter process, which requires statistically
significant information. In this paper, we present an automated framework to
support system-level voltage and frequency scaling characterization of Applied
Micro's state-of-the-art ARMv8-based multicore CPUs used in the X-Gene 2
micro-server family. The fully automated framework can provide fine-grained
information of the system's state by monitoring any abnormal behavior that may
occur during reduced supply voltage conditions. We also propose a new metric to
quantify the behavior of a microprocessor when it operates beyond nominal
conditions. Our experimental results demonstrate potential uses of the
characterization framework to identify the limits of operation for improved
energy efficiency.
