  Support Vector Data Description (SVDD) is a machine learning technique used
for single class classification and outlier detection. SVDD based K-chart was
first introduced by Sun and Tsung for monitoring multivariate processes when
underlying distribution of process parameters or quality characteristics depart
from Normality. The method first trains a SVDD model on data obtained from
stable or in-control operations of the process to obtain a threshold $R^2$ and
kernel center a. For each new observation, its Kernel distance from the Kernel
center a is calculated. The kernel distance is compared against the threshold
$R^2$ to determine if the observation is within the control limits. The
non-parametric K-chart provides an attractive alternative to the traditional
control charts such as the Hotelling's $T^2$ charts when distribution of the
underlying multivariate data is either non-normal or is unknown. But there are
challenges when K-chart is deployed in practice. The K-chart requires
calculating kernel distance of each new observation but there are no guidelines
on how to interpret the kernel distance plot and infer about shifts in process
mean or changes in process variation. This limits the application of K-charts
in big-data applications such as equipment health monitoring, where
observations are generated at a very high frequency. In this scenario, the
analyst using the K-chart is inundated with kernel distance results at a very
high frequency, generally without any recourse for detecting presence of any
assignable causes of variation. We propose a new SVDD based control chart,
called as $K_T$ chart, which addresses challenges encountered when using
K-chart for big-data applications. The $K_T$ charts can be used to
simultaneously track process variation and central tendency. We illustrate the
successful use of $K_T$ chart using the Tennessee Eastman process data.
