  We have performed fluorescence x-ray absorption fine-structure (XAFS)
measurements from 20-200 K on a 5000 \AA, c-axis film of YBa_2Cu_3O_{7-\delta}
(YBCO) on MgO (Tc=89 K) using photons polarized perpendicular to the film.
These data are compared to YBCO data from a single crystal and from a film on
LaAlO_3 with the same Tc. The main difference between the single crystal and
the film data is that while the single crystal data is well described by a
two-site axial oxygen [O(4)] distribution, we see no evidence for such a
distribution in either thin film sample. We place an upper limit on the size
ofan axial oxygen splitting for the film on MgO at < 0.09 \AA. Therefore, the
magnitude of the splitting is not directly related to Tc. Fits to the
temperature dependent data from the YBCO film on MgO indicate that all bonds
show a smooth change of their broadening factor \sigma, except the Cu-O(4)
bonds, which show an increase in \sigma in the vicinity of Tc, followed by a
decrease of the same magnitude. Such a feature does not occur in diffraction
measurements. Since XAFS measurements of \sigma include any correlation between
the atoms in a given bond, we conclude that the O(4) position becomes less
correlated with the Cu positions near Tc. Correlation measurements of these and
several further near-neighbors are also reported.
