  Scanning transmission electron microscopy (STEM) is now the primary tool for
exploring functional materials on the atomic level. Often, features of interest
are highly localized in specific regions in the material, such as ferroelectric
domain walls, extended defects, or second phase inclusions. Selecting regions
to image for structural and chemical discovery via atomically resolved imaging
has traditionally proceeded via human operators making semi-informed judgements
on sampling locations and parameters. Recent efforts at automation for
structural and physical discovery have pointed towards the use of "active
learning" methods that utilize Bayesian optimization with surrogate models to
quickly find relevant regions of interest. Yet despite the potential importance
of this direction, there is a general lack of certainty in selecting relevant
control algorithms and how to balance a priori knowledge of the material system
with knowledge derived during experimentation. Here we address this gap by
developing the automated experiment workflows with several combinations to both
illustrate the effects of these choices and demonstrate the tradeoffs
associated with each in terms of accuracy, robustness, and susceptibility to
hyperparameters for structural discovery. We discuss possible methods to build
descriptors using the raw image data and deep learning based semantic
segmentation, as well as the implementation of variational autoencoder based
representation. Furthermore, each workflow is applied to a range of feature
sizes including NiO pillars within a La:SrMnO$_3$ matrix, ferroelectric domains
in BiFeO$_3$, and topological defects in graphene. The code developed in this
manuscript are open sourced and will be released at
github.com/creangnc/AE_Workflows.
