  Intractable posterior distributions of parameters with intractable
normalizing constants depending upon the parameters are known as doubly
intractable posterior distributions. The terminology itself indicates that
obtaining Bayesian inference from such posteriors is doubly difficult compared
to traditional intractable posteriors where the normalizing constants are
tractable and admit traditional Markov Chain Monte Carlo (MCMC) solutions.
  As can be anticipated, a plethora of MCMC-based methods have originated in
the literature to deal with doubly intractable distributions. Yet, it remains
very much unclear if any of the methods can satisfactorily sample from such
posteriors, particularly in high-dimensional setups.
  In this article, we consider efficient Monte Carlo and importance sampling
approximations of the intractable normalizing constant for a few values of the
parameters, and Gaussian process interpolations for the remaining values of the
parameters, using the approximations. We then incorporate this strategy within
the exact iid sampling framework developed in Bhattacharya (2021a) and
Bhattacharya (2021b), and illustrate the methodology with simulation
experiments comprising a two-dimensional normal-gamma posterior, a
two-dimensional Ising model posterior, a two-dimensional Strauss process
posterior and a 100-dimensional autologistic model posterior. In each case we
demonstrate great accuracy of our methodology, which is also computationally
extremely efficient, often taking only a few minutes for generating 10, 000 iid
realizations on 80 processors.
