  Correlative light-electron microscopy (CLEM) unifies the versatility of light
microscopy (LM) with the high resolution of electron microscopy (EM), allowing
one to zoom into the complex organization of cells. Most CLEM techniques use
ultrathin sections, and thus lack the 3D-EM structural information, and
focusing on a very restricted field of view. Here, we introduce photonic chip
assisted CLEM, enabling multi-modal total internal reflection fluorescence
(TIRF) microscopy over large field of view and high precision localization of
the target area of interest within EM. The chip-based direct stochastic optical
reconstruction microscopy (dSTORM), and 3D high precision correlation of
biological processes by focused ion beam-scanning electron microscopy (FIB-SEM)
is further demonstrated. The core layer of the photonic chips are used as a
substrate to hold, to illuminate and the cladding layer is used to enable
high-precision landmarking of the sample through specially designed grid-like
numbering systems. The landmarks are fabricated on the cladding of the photonic
chips as extruding pillars from the waveguide surface, thus remaining visible
for FIB-SEM after resin embedding during sample processing. Using this approach
we demonstrate its applicability for tracking the area of interest, imaging the
3D structural organization of nano-sized morphological features on liver
sinusoidal endothelial cells such as fenestrations, and correlating specific
endo-lysosomal compartments with its cargo protein upon endocytosis. We
envisage that photonic chip equipped with landmarks can be used in the future
to automatize the work-flow for both LM and EM for high-throughput CLEM,
providing the resolution needed for insights into the complex intracellular
communication and the relation between morphology and function in health and
disease.
