  A combined generalized spectroscopic ellipsometry measurement and density
functional theory calculation analysis is performed to obtain the complete set
of infrared active phonon modes in Lu$_{2}$SiO$_{5}$ with monoclinic crystal
structure. Two different crystals, each cut perpendicular to a different
crystal axis are investigated. Ellipsometry measurements from 40 - 1200
cm$^{-1}$ are used to determine the frequency dependent dielectric function
tensor elements. The eigendielectric displacement vector summation approach and
eigendielectric displacement loss vector summation approach both augmented with
anharmonic lattice broadening parameters proposed recently for low-symmetry
crystal structures [A. Mock et al., Phys. Rev. B 95, 165202 (2017)] are applied
for our ellipsometry data analysis. All measured and model calculated
dielectric function tensor and inverse dielectric function tensor elements
match excellently. 23 $\mathrm{A_{u}}$ symmetry and 22 $\mathrm{B_{u}}$
symmetry infrared active transverse and longitudinal optical modes are found.
We also determine the directional limiting modes and the order of the phonon
modes within the monoclinic plane. Results from density functional theory and
ellipsometry measurements are compared and nearly perfect agreement is
observed. We further compare our results to those obtained recently for the
monoclinic crystal Y$_{2}$SiO$_{5}$, which is isostructural to
Lu$_{2}$SiO$_{5}$ [A. Mock et al., Phys. Rev. B 97, 165203 (2018)]. We find
that the lattice mode behavior of monoclinic Lu$_{2}$SiO$_{5}$ is qualitatively
identical with Y$_{2}$SiO$_{5}$, and differs only quantitatively. We anticipate
that members of the isostructural group of monoclinic symmetry
oxyorthosilicates such as Dy$_{2}$SiO$_{5}$ or Yb$_{2}$SiO$_{5}$ will likely
behave very similar in their phonon mode properties as reported here for
Lu$_{2}$SiO$_{5}$.
