  Spectroscopic x-ray detectors (SXDs) are poised to play a substantial role in
the next generation of medical x-ray imaging. Evaluating their performance in
terms of the detective quantum efficiency (DQE) requires normalization of the
frequency-dependent signal-to-noise ratio (SNR) by that of an ideal SXD. We
provide mathematical expressions of the SNR of ideal SXDs for quantification
and detection tasks and tabulate their numeric values for standardized tasks.
We propose using standardized RQA-series x-ray spectra. We define ideal SXDs as
those that (1) have an infinite number of infinitesimal energy bins, (2) do not
distort the incident distribution of x-ray photons in the spatial or energy
domains, and (3) do not decrease the frequency-dependent SNR of the incident
distribution of x-ray quanta. We derive analytic expressions for the noise
power spectrum (NPS) of such ideal detectors for detection and quantification
tasks. We tabulate the NPS of ideal SXDs for RQA x-ray spectra for detection
and quantification of aluminum, PMMA, iodine, and gadolinium basis materials.
Our analysis shows that a single matrix determines the noise power of ideal
SXDs in detection and quantification tasks, including basis material
decomposition and line-integral estimation for pseudo-mono-energetic imaging.
This NPS matrix is determined by the x-ray spectrum incident on the detector
and the mass-attenuation coefficients of the set of basis materials. Combining
existing tabulated values of the mass-attenuation coefficients of basis
materials with standardized RQA x-ray spectra enabled tabulating numeric values
of the NPS matrix for selected spectra and tasks. The numeric values and
mathematical expressions of the NPS of ideal SXDs reported here can be used to
normalize measurements of the frequency-dependent SNR of SXDs for experimental
study of the task-dependent DQE.
