  To optimize materials' stability, automated high-throughput workflows are of
increasing interest. However, many of those workflows use processes not
suitable for large-area depositions which limits the transferability of
results. While combinatorial approaches based on vapour-based depositions are
inherently scalable, their potential for controlled stability assessments has
yet to be exploited. Based on MAPbI3 thin-films as a prototypical system, we
demonstrate a combinatorial inert-gas workflow to study materials degradation
based on intrinsic factors only, closely resembling conditions in encapsulated
de-vices. Through a comprehensive set of automated X-Ray fluorescence (XRF),
X-Ray diffraction (XRD) and UV-Vis characterizations, we aim to obtain a
holistic understanding of thin-film properties of pristine and aged thin-films.
From phase changes derived from XRD characterizations before and after aging,
we observe simi-lar aging behaviours for MAPbI3 thin-films with varying PbI2
residuals. Using a custom-designed in-situ UV-Vis aging setup, the
combinatorial libraries are exposed to relevant aging conditions, such as heat
or light-bias exposure. Simultaneously, UV-Vis photospectroscopy is performed
to gain kinetic insights into the aging process which can be linked to
intrinsic degradation processes such as autocatalytic decomposition. Despite
scattering effects, which complicate the conventional interpretation of in-situ
UV-Vis results, we demonstrate how a machine learning model trained on the
comprehensive characterization data before and after the aging process can link
optical changes to phase changes during aging. Consequently, this approach does
not only enable semi-quantitative comparisons of materials' stability but also
provides detailed insights into the underlying degradation processes which are
otherwise mostly reported for investigations on single samples.
