  The quantitative characterization of the microstructure of random
heterogeneous media in $d$-dimensional Euclidean space $\mathbb{R}^d$ via a
variety of $n$-point correlation functions is of great importance, since the
respective infinite set determines the effective physical properties of the
media. In particular, surface-surface $F_{ss}$ and surface-void $F_{sv}$
correlation functions (obtainable from radiation scattering experiments)
contain crucial interfacial information that enables one to estimate transport
properties of the media (e.g., the mean survival time and fluid permeability)
and complements the information content of the conventional two-point
correlation function. However, the current technical difficulty involved in
sampling surface correlation functions has been a stumbling block in their
widespread use. We first present a concise derivation of the small-$r$
behaviors of these functions, which are linked to the \textit{mean curvature}
of the system. Then we demonstrate that one can reduce the computational
complexity of the problem by extracting the necessary interfacial information
from a cut of the system with an infinitely long line. Accordingly, we devise
algorithms based on this idea and test them for two-phase media in continuous
and discrete spaces. Specifically for the exact benchmark model of overlapping
spheres, we find excellent agreement between numerical and exact results. We
compute surface correlation functions and corresponding local surface-area
variances for a variety of other model microstructures, including hard spheres
in equilibrium, decorated "stealthy" patterns, as well as snapshots of evolving
pattern formation processes (e.g., spinodal decomposition). It is demonstrated
that the precise determination of surface correlation functions provides a
powerful means to characterize a wide class of complex multiphase
microstructures.
