  We introduce a novel three-dimensional (3D) traction force microscopy (TFM)
method motivated by the recent discovery that cells adhering on plane surfaces
exert both in-plane and out-of-plane traction stresses. We measure the 3D
deformation of the substratum on a thin layer near its surface, and input this
information into an exact analytical solution of the elastic equilibrium
equation. These operations are performed in the Fourier domain with high
computational efficiency, allowing to obtain the 3D traction stresses from raw
microscopy images virtually in real time. We also characterize the error of
previous two-dimensional (2D) TFM methods that neglect the out-of-plane
component of the traction stresses. This analysis reveals that, under certain
combinations of experimental parameters (\ie cell size, substratums' thickness
and Poisson's ratio), the accuracy of 2D TFM methods is minimally affected by
neglecting the out-of-plane component of the traction stresses. Finally, we
consider the cell's mechanosensing of substratum thickness by 3D traction
stresses, finding that, when cells adhere on thin substrata, their out-of-plane
traction stresses can reach four times deeper into the substratum than their
in-plane traction stresses. It is also found that the substratum stiffness
sensed by applying out-of-plane traction stresses may be up to 10 times larger
than the stiffness sensed by applying in-plane traction stresses.
