  We consider a binary supervised learning classification problem where instead
of having data in a finite-dimensional Euclidean space, we observe measures on
a compact space $\mathcal{X}$. Formally, we observe data $D_N = (\mu_1, Y_1),
\ldots, (\mu_N, Y_N)$ where $\mu_i$ is a measure on $\mathcal{X}$ and $Y_i$ is
a label in $\{0, 1\}$. Given a set $\mathcal{F}$ of base-classifiers on
$\mathcal{X}$, we build corresponding classifiers in the space of measures. We
provide upper and lower bounds on the Rademacher complexity of this new class
of classifiers that can be expressed simply in terms of corresponding
quantities for the class $\mathcal{F}$. If the measures $\mu_i$ are uniform
over a finite set, this classification task boils down to a multi-instance
learning problem. However, our approach allows more flexibility and diversity
in the input data we can deal with. While such a framework has many possible
applications, this work strongly emphasizes on classifying data via topological
descriptors called persistence diagrams. These objects are discrete measures on
$\mathbb{R}^2$, where the coordinates of each point correspond to the range of
scales at which a topological feature exists. We will present several
classifiers on measures and show how they can heuristically and theoretically
enable a good classification performance in various settings in the case of
persistence diagrams.
