  The problem of statistical calibration of a measuring instrument can be
framed both in a statistical context as well as in an engineering context. In
the first, the problem is dealt with by distinguishing between the 'classical'
approach and the 'inverse' regression approach. Both of these models are static
models and are used to estimate exact measurements from measurements that are
affected by error. In the engineering context, the variables of interest are
considered to be taken at the time at which you observe it. The Bayesian time
series analysis method of Dynamic Linear Models (DLM) can be used to monitor
the evolution of the measures, thus introducing an dynamic approach to
statistical calibration. The research presented employs the use of Bayesian
methodology to perform statistical calibration. The DLM's framework is used to
capture the time-varying parameters that maybe changing or drifting over time.
Two separate DLM based models are presented in this paper. A simulation study
is conducted where the two models are compared to some well known 'static'
calibration approaches in the literature from both the frequentist and Bayesian
perspectives. The focus of the study is to understand how well the dynamic
statistical calibration methods performs under various signal-to-noise ratios,
r. The posterior distributions of the estimated calibration points as well as
the 95% coverage intervals are compared by statistical summaries. These dynamic
methods are applied to a microwave radiometry data set.
