  Liquid water has been proved to be an excellent medium for specimen structure
imaging by a scanning electron microscope. Knowledge of electron-water
interaction physics and particularly the secondary electron yield is essential
to the interpretation of the imaging contrast. However, very little is known up
to now experimentally on the low energy electron interaction with liquid water
because of certain practical limitations. It is then important to gain some
useful information about electron emission from water by a Monte Carlo (MC)
simulation technique that can numerically model electron transport trajectories
in water. In this study, we have performed MC simulations of electron emission
from liquid water in the primary energy range of 50 eV-30 keV by using two
different codes, i.e. a classical MC (CMC) code developed in our laboratory and
the Geant4-DNA (G4DNA) code. The calculated secondary electron yield and
electron backscattering coefficient are compared with experimental results
wherever applicable to verify the validity of physical models for the
electron-water interaction. The secondary electron yield vs. primary energy
curves calculated by the two codes present the same generic curve shape as that
of metals but in rather different absolute values. G4DNA yields the
underestimated absolute values due to the application of one step
thermalization model by setting a cutoff energy at 7.4 eV so that the low
energy losses due to phonon excitations are omitted. Our CMC calculation of
secondary electron yield is closer to the experimental data and the energy
distribution is reasonable. It is concluded that a full dielectric function
data at low energy loss values below 7.4 eV shall be employed in G4DNA model
for the modeling of low energy electrons.
