  Quantum sensing is highly attractive for accessing spectral regions in which
the detection of photons is technically challenging: sample information is
gained in the spectral region of interest and transferred via entanglement into
another spectral range, for which highly sensitive detectors are available.
This is especially beneficial for terahertz radiation, as the corresponding
photon energy lies in the range of a few meV - an energy where no semiconductor
detectors are available and coherent detection schemes or cryogenically cooled
bolometers have to be employed. Here, we report on the first demonstration of
quantum sensing in the terahertz frequency range in which the terahertz photons
interact with a sample in free space and information about the sample thickness
is obtained by the detection of visible photons. A nonlinear single-crystal
interferometer setup with a periodically poled lithium niobate crystal (PPLN)
and a 660 nm pump source is used, generating visible (signal) photons and
associated (idler) photons in the terahertz frequency range. Separation from
the pump photons and detection of the visible signal photons is achieved by
using highly efficient and narrowband volume Bragg gratings and an uncooled
scientific complementary metal-oxide-semiconductor (sCMOS) camera. The acquired
frequency-angular spectra show quantum interference in the Stokes as well as
the Anti-Stokes part of collinear forward generation caused by spontaneous
parametric down-conversion (SPDC) and down-conversion as well as up-conversion
of thermal photons. The information encoded in the quantum interference can be
used to determine the thickness of coatings or functional layers that are
mainly transparent in the terahertz spectral range. As a first demonstration,
we show layer thickness measurements with terahertz photons based on induced
coherence without induced emission.
