  Growth in the complexity and capabilities of quantum information hardware
mandates access to practical techniques for performance verification that
function under realistic laboratory conditions. Here we experimentally
characterise the impact of common temporally correlated noise processes on both
randomised benchmarking (RB) and gate-set tomography (GST). We study these
using an analytic toolkit based on a formalism mapping noise to errors for
arbitrary sequences of unitary operations. This analysis highlights the role of
sequence structure in enhancing or suppressing the sensitivity of quantum
verification protocols to either slowly or rapidly varying noise, which we
treat in the limiting cases of quasi-DC miscalibration and white noise power
spectra. We perform experiments with a single trapped $^{171}$Yb$^{+}$ ion as a
qubit and inject engineered noise ($\propto \sigma^z$) to probe protocol
performance. Experiments on RB validate predictions that the distribution of
measured fidelities over sequences is described by a gamma distribution varying
between approximately Gaussian for rapidly varying noise, and a broad, highly
skewed distribution for the slowly varying case. Similarly we find a strong
gate set dependence of GST in the presence of correlated errors, leading to
significant deviations between estimated and calculated diamond distances in
the presence of correlated $\sigma^z$ errors. Numerical simulations demonstrate
that expansion of the gate set to include negative rotations can suppress these
discrepancies and increase reported diamond distances by orders of magnitude
for the same error processes. Similar effects do not occur for correlated
$\sigma^x$ or $\sigma^y$ errors or rapidly varying noise processes,
highlighting the critical interplay of selected gate set and the gauge
optimisation process on the meaning of the reported diamond norm in correlated
noise environments.
