  Understanding the local behaviour of structured multi-dimensional data is a
fundamental problem in various areas of computer science. As the amount of data
is often huge, it is desirable to obtain sublinear time algorithms, and
specifically property testers, to understand local properties of the data.
  We focus on the natural local problem of testing pattern freeness: given a
large $d$-dimensional array $A$ and a fixed $d$-dimensional pattern $P$ over a
finite alphabet, we say that $A$ is $P$-free if it does not contain a copy of
the forbidden pattern $P$ as a consecutive subarray. The distance of $A$ to
$P$-freeness is the fraction of entries of $A$ that need to be modified to make
it $P$-free. For any $\epsilon \in [0,1]$ and any large enough pattern $P$ over
any alphabet, other than a very small set of exceptional patterns, we design a
tolerant tester that distinguishes between the case that the distance is at
least $\epsilon$ and the case that it is at most $a_d \epsilon$, with query
complexity and running time $c_d \epsilon^{-1}$, where $a_d < 1$ and $c_d$
depend only on $d$.
  To analyze the testers we establish several combinatorial results, including
the following $d$-dimensional modification lemma, which might be of independent
interest: for any large enough pattern $P$ over any alphabet (excluding a small
set of exceptional patterns for the binary case), and any array $A$ containing
a copy of $P$, one can delete this copy by modifying one of its locations
without creating new $P$-copies in $A$.
  Our results address an open question of Fischer and Newman, who asked whether
there exist efficient testers for properties related to tight substructures in
multi-dimensional structured data. They serve as a first step towards a general
understanding of local properties of multi-dimensional arrays, as any such
property can be characterized by a fixed family of forbidden patterns.
