  We have designed, optimized, fabricated and characterized highly reflective
quasi-omnidirectional (angular range of $0-60^\circ$) multilayered structures
with a wide spectral range. Two techniques, chirping (a continuous change in
thicknesses) and stacking of Bragg-type sub-structures, have been used to
enhance the reflectance with minimum thickness for a given pair of refractive
indices. Numerical calculations were carried out employing the transfer matrix
method and we optimized the design parameters to obtain maximal reflectance
averaged over different spectral ranges for all angles. We fabricated some of
the optimized structures with porous silicon dielectric multilayers with low
refractive contrast and compared their measured optical properties with the
calculations. Two chirped structures with thicknesses 21.6 $\mu$m and 60.4
$\mu$m, resulting in quasi omnidirectional mirrors with bandwidths of 360 nm
and 1800 nm, centered at 1160 nm and 1925 nm respectively have been shown. In
addition, we fabricated a stacked sub-Bragg mirror structure with a quasi
omnidirectional bandwidth of 1800 nm (centered at 1850 nm) and a thickness of
41.5 $\mu$m, which is almost two third (in thickness) of the chirped structure.
Thus, our techniques allowed us to obtain relatively thin quasi-omnidirectional
mirrors with wide bands over different wavelength ranges. Our analysis
techniques can be used for the optimization of the reflectance not only in
multilayered PS systems with different refractive index contrasts but also for
systems with other types of materials with low refractive index contrast. The
present study could also be useful for obtaining omnidirectional dielectric
mirrors in large spectral regions using different materials, flat focusing
reflectors, thermal regulators, or, if defects are included, as filters or
remote chemical/biosensors with a wide angular independent response.
