  Precise knowledge of X-ray diffraction profile shape is crucial in the
investigation of the properties of matter in crystals powder. Line-broadening
analysis is a pre-processing step in most of the full powder pattern fitting
softwares. Final result of line-broadening analysis strongly depends on
preliminary three steps: Noise filtering, removal of background signal and peak
fitting. In this work a new model independent procedure for two of the
aforementioned steps (background suppression and peak fitting) is presented.
The former is dealt with by using morphological mathematics, while the latter
relies on the Hankel Lanczos Singular Value Decomposition technique. Real X-ray
powder diffraction (XRPD) intensity profiles of Ceria samples are used to test
the performance of the proposed procedure. Results show the robustness of this
approach and its capability of efficiently improving the disentangling of
instrumental broadening. These features make the proposed approach an
interesting and user-friendly tool for the pre-processing of XRPD data.
