  An efficient randomized polynomial identity test for noncommutative
polynomials given by noncommutative arithmetic circuits remains an open
problem. The main bottleneck to applying known techniques is that a
noncommutative circuit of size $s$ can compute a polynomial of degree
exponential in $s$ with a double-exponential number of nonzero monomials. In
this paper, we report some progress by dealing with two natural subcases (both
allow for polynomials of exponential degree and a double exponential number of
monomials): (1) We consider \emph{$+$-regular} noncommutative circuits: these
are homogeneous noncommutative circuits with the additional property that all
the $+$-gates are layered, and in each $+$-layer all gates have the same
syntactic degree. We give a \emph{white-box} polynomial-time deterministic
polynomial identity test for such circuits. Our algorithm combines some new
structural results for $+$-regular circuits with known results for
noncommutative ABP identity testing [RS05PIT], rank bound of commutative depth
three identities [SS13], and equivalence testing problem for words [Loh15,
MSU97, Pla94]. (2) Next, we consider $\Sigma\Pi^*\Sigma$ noncommutative
circuits: these are noncommutative circuits with layered $+$-gates such that
there are only two layers of $+$-gates. These $+$-layers are the output
$+$-gate and linear forms at the bottom layer; between the $+$-layers the
circuit could have any number of $\times$ gates. We given an efficient
randomized \emph{black-box} identity testing problem for $\Sigma\Pi^*\Sigma$
circuits. In particular, we show if $f\in F<Z>$ is a nonzero noncommutative
polynomial computed by a $\Sigma\Pi^*\Sigma$ circuit of size $s$, then $f$
cannot be a polynomial identity for the matrix algebra $\mathbb{M}_s(F)$, where
the field $F$ is a sufficiently large extension of $F$ depending on the degree
of $f$.
