  Halide perovskites excel in the pursuit of highly efficient thin film
photovoltaics, with power conversion efficiencies reaching 25.5% in single
junction and 29.5% in tandem halide perovskite/silicon solar cell
configurations. Operational stability of perovskite solar cells remains a
barrier to their commercialisation, yet a fundamental understanding of
degradation processes, including the specific sites at which failure mechanisms
occur, is lacking. Recently, we reported that performance-limiting deep
sub-bandgap states appear in nanoscale clusters at particular grain boundaries
in state-of-the-art $Cs_{0.05}FA_{0.78}MA_{0.17}Pb(I_{0.83}Br_{0.17})_{3}$
(MA=methylammonium, FA=formamidinium) perovskite films. Here, we combine
multimodal microscopy to show that these very nanoscale defect clusters, which
go otherwise undetected with bulk measurements, are sites at which degradation
seeds. We use photoemission electron microscopy to visualise trap clusters and
observe that these specific sites grow in defect density over time under
illumination, leading to local reductions in performance parameters. Scanning
electron diffraction measurements reveal concomitant structural changes at
phase impurities associated with trap clusters, with rapid conversion to
metallic lead through iodine depletion, eventually resulting in pinhole
formation. By contrast, illumination in the presence of oxygen reduces defect
densities and reverses performance degradation at these local clusters, where
phase impurities instead convert to amorphous and electronically benign lead
oxide. Our work shows that the trapping of charge carriers at sites associated
with phase impurities, itself reducing performance, catalyses redox reactions
that compromise device longevity. Importantly, we reveal that both performance
losses and intrinsic degradation can be mitigated by eliminating these
defective clusters.
