  Low-loss electron energy loss spectroscopy (EELS) has emerged as a technique
of choice for exploring the localization of plasmonic phenomena at the
nanometer level, necessitating analysis of physical behaviors from 3D spectral
data sets. For systems with high localization, linear unmixing methods provide
an excellent basis for exploratory analysis, while in more complex systems
large numbers of components are needed to accurately capture the true plasmonic
response and the physical interpretability of the components becomes uncertain.
Here, we explore machine learning based analysis of low-loss EELS data on
heterogeneous self-assembled monolayer films of doped-semiconductor
nanoparticles, which support infrared resonances. We propose a pathway for
supervised analysis of EELS datasets that separate and classify regions of the
films with physically distinct spectral responses. The classifications are
shown to be robust, to accurately capture the common spatiospectral tropes of
the complex nanostructures, and to be transferable between different datasets
to allow high-throughput analysis of large areas of the sample. As such, it can
be used as a basis for automated experiment workflows based on Bayesian
optimization, as demonstrated on the ex situ data. We further demonstrate the
use of non-linear autoencoders (AE) combined with clustering in the latent
space of the AE yields highly reduced representations of the system response
that yield insight into the relevant physics that do not depend on operator
input and bias. The combination of these supervised and unsupervised tools
provides complementary insight into the nanoscale plasmonic phenomena.
