  An approach for compensating the influence of the interrogator noises on the
readings of interferometric sensors, interrogated by means of spectral
interferometry with wavelength tuning is proposed. Both theoretical analysis
and a proof-of-principle experiment were performed for the example of extrinsic
Fabry-Perot interferometers (EFPI). Two schemes, comprising of a signal and a
reference interferometers, switched in different optical channels of the
interrogating unit, were proposed. The approach is based on the fact that the
fluctuations of some of the interrogator parameters produce correlated
fluctuations of the reference and signal interferometers optical path
differences (OPD) measured values. The fluctuations of the reference
interferometers measured OPD can be subtracted from the measured OPD of the
signal interferometer. The fluctuations of different parameters of the
interrogator are considered, the correlation properties of the produced noises
of the measured OPD values are demonstrated. The first scheme contains two
interferometers with similar parameters and enabled a three-fold resolution
improvement in the performed experiments, when the difference of the
interferometers OPDs was varied within about 10 nm. The second scheme contains
two interferometers with OPDs difference such that all interrogator
fluctuations, except for the dominating one produce uncorrelated OPD errors.
With the second scheme a two-fold resolution improvement was experimentally
demonstrated, when the interferometers OPDs difference was varied within more
than 1 \mum. The proposed approach can be used for improving the resolution of
interferometric sensors with relatively large OPDs (greater than 200-300 \mum),
which can be advantageous for remote materials and surface inspection.
