  Distance measures play an important role in shape classification and data
analysis problems. Topological distances based on Reeb graphs and persistence
diagrams have been employed to obtain effective algorithms in shape matching
and scalar data analysis. In the current paper, we propose an improved distance
measure between two multi-fields by computing a multi-dimensional Reeb graph
(MDRG) each of which captures the topology of a multi-field through a hierarchy
of Reeb graphs in different dimensions. A hierarchy of persistence diagrams is
then constructed by computing a persistence diagram corresponding to each Reeb
graph of the MDRG. Based on this representation, we propose a novel distance
measure between two MDRGs by extending the bottleneck distance between two Reeb
graphs. We show that the proposed measure satisfies the pseudo-metric and
stability properties. We examine the effectiveness of the proposed multi-field
topology-based measure on two different applications: (1) shape classification
and (2) detection of topological features in a time-varying multi-field data.
In the shape classification problem, the performance of the proposed measure is
compared with the well-known topology-based measures in shape matching. In the
second application, we consider a time-varying volumetric multi-field data from
the field of computational chemistry where the goal is to detect the site of
stable bond formation between Pt and CO molecules. We demonstrate the ability
of the proposed distance in classifying each of the sites as occurring before
and after the bond stabilization.
