  The analysis of optical spectra - emission or absorption -- has been arguably
the most powerful approach for discovering and understanding matters. The
invention and development of many kinds of spectrometers have equipped us with
versatile yet ultra-sensitive diagnostic tools for trace gas detection, isotope
analysis, and resolving hyperfine structures of atoms and molecules. With
proliferating data and information, urgent and demanding requirements have been
placed today on spectrum analysis with ever-increasing spectral bandwidth and
frequency resolution. These requirements are especially stringent for broadband
laser sources that carry massive information, and for dispersive devices used
in information processing systems. In addition, spectrum analyzers are expected
to probe the device's phase response where extra information is encoded. Here
we demonstrate a novel vector spectrum analyzer (VSA) that is capable of
characterizing passive devices and active laser sources in one setup. Such a
dual-mode VSA can measure loss, phase response and dispersion properties of
passive devices. It also can coherently map a broadband laser spectrum into the
RF domain. The VSA features a bandwidth of 55.1 THz (1260 to 1640 nm),
frequency resolution of 471 kHz, and dynamic range of 56 dB. Meanwhile, our
fiber-based VSA is compact and robust. It requires neither high-speed
modulators and photodetectors, nor any active feedback control. Finally, we
successfully employ our VSA for applications including characterization of
integrated dispersive waveguides, mapping frequency comb spectra, and coherent
light detection and ranging (LiDAR). Our VSA presents an innovative approach
for device analysis and laser spectroscopy, and can play a critical role in
future photonic systems and applications for sensing, communication, imaging,
and quantum information processing.
