  Understanding the contact between solid surfaces is a long standing problem
which has a strong impact on the physics of many processes such as adhesion,
friction, lubrication and wear. Experimentally, the investigation of
solid/solid interfaces remains challenging today, due to the lack of
experimental techniques able to provide sub-nanometer scale information on
interfaces buried between millimeters of materials. Yet, a strong interest
exists improving the modeling of contact mechanics of materials in order to
adjust their interface properties (e.g. thermal transport, friction). We show
here that the essential features of the residual gap between contacting
surfaces can be measured using high energy X-ray synchrotron reflectivity. The
presence of this nano-gap is general to the contact of solids. In some special
case however, it can be removed when attractive forces take over repulsive
contributions, depending on both height and wavelength of asperity
distributions (roughness). A criterion for this instability is established in
the standard case of van der Waals attractive forces and elastic asperity
compression repulsive forces (Hertz model). This collapse instability is
confirmed experimentally in the case of silicon direct bonding, using
high-energy X-ray synchrotron reflectivity and adhesion energy measurements.
The possibility to achieve fully closed interfaces at room temperature opens
interesting perspectives to build stronger assemblies with smaller thermal
budgets.
