  Molecular electronics break-junction experiments are widely used to
investigate fundamental physics and chemistry at the nanoscale. Reproducibility
in these experiments relies on measuring conductance on thousands of freshly
formed molecular junctions, yielding a broad histogram of conductance events.
Experiments typically focus on the most probable conductance, while the
information content of the conductance histogram has remained unclear. Here, we
develop a theory for the conductance histogram, which accurately fits
experimental data and augments the information content that can be extracted,
by merging the theory of force-spectroscopy with molecular conductance.
Specifically, we propose a microscopic model of the junction evolution under
the modulation of external mechanical forces and combine it with the
non-equilibrium stochastic features of junction rupture and formation. Our
formulation captures contributions to the conductance dispersion that emerge
due to changes in the conductance during the mechanical elongation inherent to
the experiments. The final histogram shape is determined by the statistics of
junction rupture and formation. The procedure yields analytical equations for
the conductance histogram in terms of parameters that describe the free-energy
profile of the junction, its mechanical manipulation, and the ability of the
molecule to transport charge. All physical parameters that define our
microscopic model can be obtained from separate conductance and rupture force
measurements on molecular junctions. Further, the predicted behavior with
respect to physical parameters can be used to test the range of validity of the
microscopic model, understand the conductance histograms, and design molecular
junction experiments with enhanced resolution and molecular devices with more
reproducible conductance properties.
