  Perovskite thin films hold great promise for optoelectronic applications,
such as solar cells and light emitting diodes. A challenge is that defects are
unavoidably formed in the material. Thorough understanding of the defect
formation and their dynamics has proven challenging based on traditional
spectroscopy. Here we integrated the functional intensity modulation two-photon
spectroscopy with artificial intelligence - enhance data analyses to obtain a
deep understanding of defect-related trap states within perovskite
microcrystals. We introduce a novel charge carrier recombination dynamics model
that comprehensively includes exciton and electron-hole pair photoluminescence
(PL) emissions, as well as the trapping and detrapping equilibrium dynamics. By
varying parameters in the dynamic model, a large pool of the temperature
dependent intensity modulation PL spectra can be simulated by solving the
ordinary differential equations in the charge carrier dynamics model. Then,
tree-based supervised machine learning methods and ensemble technique --
regression chain have been used to optimize the Machine learning intensity
modulation spectroscopy (Mlim), which helps to determine the parameters of the
charge carrier dynamics model based on the temperature dependent intensity
modulated PL spectra in perovskite. And the reliability of the Mlim predicted
trap property parameters is confirmed by directly comparing the Mlim-retrieved
intensity modulation spectra with experimental data. Besides, our approach
unravels valuable insights into PL emissions, including those from excitons and
free electron-hole pairs, but also provides details of trapping, detrapping,
and nonradiative depopulation processes, offering a comprehensive understanding
of perovskite material photophysics. This study suggests that Mlim applications
hold promise for studying various photoactive devices.
