  Distributional transformations characterized by equations relating
expectations of test functions weighted by a given biasing function on the
original distribution to expectations of the test function's higher derivatives
with respect to the transformed distribution play a great role in Stein's
method and were, in great generality, first considered by Goldstein and Reinert
\cite{GolRei05b}. We prove two abstract existence and uniqueness results for
such distributional transformations, generalizing their $X-P$ bias
transformation. On the one hand, we show how one can abandon previously
necessary orthogonality relations by subtracting an explicitly known polynomial
depending on the test function from the test function itself. On the other
hand, we prove that for a given nonnegative integer $m$ it is possible to
obtain the expectation of the $m$-th derivative of the test function with
respect to the transformed distribution in the defining equation, even though
the biasing function may have $k<m$ sign changes, if these two numbers have the
same parity. We explain, how these results can be used to guarantee the
existence of two different generalizations of the zero bias transformation by
Goldstein and Reinert \cite{GolRei97}. Further applications include the
derivation of Stein type characterizations without needing to solve any Stein
equation and the presentation of a general framework of estimating the distance
of the distribution of a given real random variable $X$ to that of a random
variable $Z$, whose distribution is characterized by some $m$-th order linear
differential operator. We also explain the fact that, in general, the biased
distribution depends on the choice of the sign change points, if these are
ambiguous. This new phenomenon does not appear in the framework from
\cite{GolRei05b}.
