  The scaling of plasmoid instability maximum linear growth rate with respect
to Lundquist number $S$ in a Sweet-Parker current sheet, $\gamma_{max}\sim
S^{1/4}$, indicates that at high $S$, the current sheet will break apart before
it approaches the Sweet-Parker width. Therefore, a proper description for the
onset of the plasmoid instability must incorporate the evolving process of the
current sheet. We carry out a series of two-dimensional simulations and develop
diagnostics to separate fluctuations from an evolving background. It is found
that the fluctuation amplitude starts to grow only when the linear growth rate
is sufficiently large ($\gamma_{max}\tau_{A}>O(1)$) to overcome convective
losses. The linear growth rate continues to rise until the sizes of plasmoids
become comparable to the inner layer width of the tearing mode. At this point
the current sheet is disrupted and the instability enters the early nonlinear
regime. The growth rate suddenly decreases, but the fluctuation amplitude
continues to grow until it reaches nonlinear saturation. We identify important
time scales of the instability development, as well as scalings for the linear
growth rate, current sheet width, and dominant wavenumber at current sheet
disruption. These scalings depend on not only the Lundquist number, but also
the initial noise amplitude. A phenomenological model that reproduces scalings
from simulation results is proposed. The model incorporates the effect of
reconnection outflow, which is crucial for yielding a critical Lundquist number
$S_{c}$ below which disruption does not occur. The critical Lundquist number
$S_{c}$ is not a constant value but has a weak dependence on the noise
amplitude.
