  Linear super-resolution microscopy via synthesis aperture approach permits
fast acquisition because of its wide-field implementations, however, it has
been limited in resolution because a missing spatial-frequency band occurs when
trying to use a shift magnitude surpassing the cutoff frequency of the
detection system beyond a factor of two, which causes ghosting to appear. Here,
we propose a method of chip-based 3D nanoscopy through large and tunable
spatial-frequency-shift effect, capable of covering full extent of the
spatial-frequency component within a wide passband. The missing of
spatial-frequency can be effectively solved by developing a
spatial-frequency-shift actively tuning approach through wave vector
manipulation and operation of optical modes propagating along multiple
azimuthal directions on a waveguide chip to interfere. In addition, the method
includes a chip-based sectioning capability, which is enabled by saturated
absorption of fluorophores. By introducing ultra-large propagation effective
refractive index, nanoscale resolution is possible, without sacrificing the
temporal resolution and the field-of-view. Imaging on GaP waveguide material
demonstrates a lateral resolution of lamda/10, which is 5.4 folds above Abbe
diffraction limit, and an axial resolution of lamda/19 using 0.9 NA detection
objective. Simulation with an assumed propagation effective refractive index of
10 demonstrates a lateral resolution of lamda/22, in which the huge gap between
the directly shifted and the zero-order components is completely filled to
ensure the deep-subwavelength resolvability. It means that, a fast wide-field
3D deep-subdiffraction visualization could be realized using a standard
microscope by adding a mass-producible and cost-effective
spatial-frequency-shift illumination chip.
