  An approach is introduced for the non-parametric reconstruction of the
statistical properties of penetrable, isotropic randomly rough surfaces from
in-plane, co-polarized light scattering data. Starting from expressions within
the Kirchhoff approximation for the light scattered diffusely by a
two-dimensional randomly rough surface, an analytic expression for the
normalized surface height correlation function is obtained as an integral over
the in-plane and co-polarized scattering data with the introduction of only a
couple of additional approximations. The inversion approach consists of two
main steps. In the first step the surface roughness is estimated. Next, this
value is used to obtain the functional form of the surface height correlation
function without initially assuming any particular form for this function
(non-parametric inversion). The input data used in validating this inversion
approach consist of in-plane and co-polarized scattering data obtained for
different forms of the correlation function by either computer simulations or
by experiments for two-dimensional randomly rough dielectric or metallic
surfaces. Good agreement was obtained between the correlation function and
surface roughness obtained during the reconstruction and the corresponding
quantities assumed when generating the input scattering data; this was the case
for both dielectric and metallic surfaces, for both p- and s-polarized light,
and for different polar angles of incidence. The proposed inversion approach
provides an accurate, efficient, robust and contact-less method based on
in-plane and co-polarized scattering data for the non-parametric
characterization of the statistical properties of isotropic two-dimensional
randomly rough dielectric and metallic surface.
