  Single-emitter microscopy has emerged as a promising method of imaging
nanostructures with nanoscale resolution. This technique uses the centroid
position of an emitters far-field radiation pattern to infer its position to a
precision that is far below the diffraction limit. However, nanostructures
composed of high-dielectric materials such as noble metals can distort the
far-field radiation pattern. Nanoparticles also exhibit a more complex range of
distortions, because in addition to introducing a high dielectric surface, they
also act as efficient scatterers. Thus, the distortion effects of nanoparticles
in single-emitter microscopy remains poorly understood. Here we demonstrate
that metallic nanoparticles can significantly distort the accuracy of
single-emitter imaging at distances exceeding 300 nm. We use a single quantum
dot to probe both the magnitude and the direction of the metallic
nanoparticle-induced imaging distortion and show that the diffraction spot of
the quantum dot can shift by more than 35 nm. The centroid position of the
emitter generally shifts away from the nanoparticle position, in contradiction
to the conventional wisdom that the nanoparticle is a scattering object that
will pull in the diffraction spot of the emitter towards its center. These
results suggest that dielectric distortion of the emission pattern dominates
over scattering. We also show that by monitoring the distortion of the quantum
dot diffraction spot we can obtain high-resolution spatial images of the
nanoparticle, providing a new method for performing highly precise,
sub-diffraction spatial imaging. These results provide a better understanding
of the complex near-field coupling between emitters and nanostructures, and
open up new opportunities to perform super-resolution microscopy with higher
accuracy.
