  DNA methylation (DNAme) is a critical component of the epigenetic regulatory
machinery and aberrations in DNAme patterns occur in many diseases, such as
cancer. Mapping and understanding DNAme profiles offers considerable promise
for reversing the aberrant states. There are several approaches to analyze
DNAme, which vary widely in cost, resolution and coverage. Affinity capture and
high-throughput sequencing of methylated DNA strike a good balance between the
high cost of whole genome bisulphite sequencing (WGBS) and the low coverage of
methylation arrays. However, existing methods cannot adequately differentiate
between hypomethylation patterns and low capture efficiency, and do not offer
flexibility to integrate copy number variation (CNV). Furthermore, no
uncertainty estimates are provided, which may prove useful for combining data
from multiple protocols or propagating into downstream analysis. We propose an
empirical Bayes framework that uses a fully methylated (i.e. SssI treated)
control sample to transform observed read densities into regional methylation
estimates. In our model, inefficient capture can be distinguished from low
methylation levels by means of larger posterior variances. Furthermore, we can
integrate CNV by introducing a multiplicative offset into our Poisson model
framework. Notably, our model offers analytic expressions for the mean and
variance of the methylation level and thus is fast to compute. Our algorithm
outperforms existing approaches in terms of bias, mean-squared error and
coverage probabilities as illustrated on multiple reference datasets. Although
our method provides advantages even without the SssI-control, considerable
improvement is achieved by its incorporation. Our method can be applied to
methylated DNA affinity enrichment assays (e.g MBD-seq, MeDIP-seq) and a
software implementation is available in the Bioconductor Repitools package.
