  A new method has been developed for the correction of the distortions and/or
enhanced phase differentiation in Electron Backscatter Diffraction (EBSD) data.
Using a multi-modal data approach, the method uses segmented images of the
phase of interest (laths, precipitates, voids, inclusions) on images gathered
by backscattered or secondary electrons of the same area as the EBSD map. The
proposed approach then search for the best transformation to correct their
relative distortions and recombines the data in a new EBSD file. Speckles of
the features of interest are first segmented in both the EBSD and image data
modes. The speckle extracted from the EBSD data is then meshed, and the
Covariance Matrix Adaptation Evolution Strategy (CMA-ES) is implemented to
distort the mesh until the speckles superimpose. The quality of the matching is
quantified via a score that is linked to the number of overlapping pixels in
the speckles. The locations of the points of the distorted mesh are compared to
those of the initial positions to create pairs of matching points that are used
to calculate the polynomial function that describes the distortion the best.
This function is then applied to un-distort the EBSD data, and the phase
information is inferred using the data of the segmented speckle. Fast and
versatile, this method does not require any human annotation and can be applied
to large datasets and wide areas. Besides, this method requires very few
assumptions concerning the shape of the distortion function. It can be used for
the single compensation of the distortions or combined with the phase
differentiation. The accuracy of this method is of the order of the pixel size.
Some application examples in multiphase materials with feature sizes down to 1
$\mu$m are presented, including Ti-6Al-4V Titanium alloy, Rene 65 and additive
manufactured Inconel 718 Nickel-base superalloys.
