  Recent advances in scanning tunneling and transmission electron microscopies
(STM and STEM) have allowed routine generation of large volumes of imaging data
containing information on the structure and functionality of materials. The
experimental data sets contain signatures of long-range phenomena such as
physical order parameter fields, polarization and strain gradients in STEM, or
standing electronic waves and carrier-mediated exchange interactions in STM,
all superimposed onto scanning system distortions and gradual changes of
contrast due to drift and/or mis-tilt effects. Correspondingly, while the human
eye can readily identify certain patterns in the images such as lattice
periodicities, repeating structural elements, or microstructures, their
automatic extraction and classification are highly non-trivial and universal
pathways to accomplish such analyses are absent. We pose that the most
distinctive elements of the patterns observed in STM and (S)TEM images are
similarity and (almost-) periodicity, behaviors stemming directly from the
parsimony of elementary atomic structures, superimposed on the gradual changes
reflective of order parameter distributions. However, the discovery of these
elements via global Fourier methods is non-trivial due to variability and lack
of ideal discrete translation symmetry. To address this problem, we develop
shift-invariant variational autoencoders (shift-VAE) that allow disentangling
characteristic repeating features in the images, their variations, and shifts
inevitable for random sampling of image space. Shift-VAEs balance the
uncertainty in the position of the object of interest with the uncertainty in
shape reconstruction. This approach is illustrated for model 1D data, and
further extended to synthetic and experimental STM and STEM 2D data.
