  In this paper, we present a critical overview of statistical fiber bundles
models. We discuss relevant aspects, like assumptions and consequences stemming
from models in the literature and propose new ones. This is accomplished by
concentrating on both the physical and statistical aspects of a specific
load-sharing example, the breakdown (BD) for circuits of capacitors and related
dielectrics. For series and parallel/series circuits (series/parallel
reliability systems) of ordinary capacitors, the load-sharing rules are derived
from the electrical laws. This with the BD formalism is then used to obtain the
BD distribution of the circuit. The BD distribution and Gibbs measure are given
for a series circuit and the size effects are illustrated for simulations of
series and parallel/series circuits. This is related to the finite weakest link
adjustments for the BD distribution that arise in large series/parallel
reliability load-sharing systems, such as dielectric BD, from their extreme
value approximations.
  An elementary but in-depth discussion of the physical aspects of SiO$_2$ and
HfO$_2$ dielectrics and cell models is given. This is used to study a
load-sharing cell model for the BD of HfO$_2$ dielectrics and the BD formalism.
The latter study is based on an analysis of Kim and Lee (2004)'s data for such
dielectrics. Here, several BD distributions are compared in the analysis and
proportional hazard regression models are used to study the BD formalism. In
addition, some areas of open research are discussed.
