  The universal tendency in scanning probe microscopy (SPM) over the last two
decades is to transition from simple 2D imaging to complex detection and
spectroscopic imaging modes. The emergence of complex SPM engines brings forth
the challenge of reliable data interpretation, i.e. conversion from detected
signal to descriptors specific to tip-surface interactions and subsequently to
materials properties. Here, we implemented a Bayesian inference approach for
the analysis of the image formation mechanisms in band excitation (BE) SPM.
Compared to the point estimates in classical functional fit approaches,
Bayesian inference allows for the incorporation of extant knowledge of
materials and probe behavior in the form of corresponding prior distribution
and return the information on the material functionality in the form of readily
interpretable posterior distributions. We note that in application of Bayesian
methods, special care should be made for proper setting on the problem as model
selection vs. establishing practical parameter equivalence. We further explore
the non-linear mechanical behaviors at topological defects in a classical
ferroelectric material, PbTiO3. We observe the non-trivial evolution of Duffing
resonance frequency and the nonlinearity of the sample surface, suggesting the
presence of the hidden elements of domain structure. These observations suggest
that the spectrum of anomalous behaviors at the ferroelectric domain walls can
be significantly broader than previously believed and can extend to
non-conventional mechanical properties in addition to static and microwave
conductance.
