  We present a method based on the scattering $\mathbb{T}$ operator, and
conservation of net real and reactive power, to provide physical bounds on any
electromagnetic design objective that can be framed as a net radiative
emission, scattering or absorption process. Application of this approach to
planewave scattering from an arbitrarily shaped, compact body of homogeneous
electric susceptibility $\chi$ is found to predictively quantify and
differentiate the relative performance of dielectric and metallic materials
across all optical length scales. When the size of a device is restricted to be
much smaller than the wavelength (a subwavelength cavity, antenna,
nanoparticle, etc.), the maximum cross section enhancement that may be achieved
via material structuring is found to be much weaker than prior predictions: the
response of strong metals ($\mathrm{Re}[\chi] < 0$) exhibits a diluted
(homogenized) effective medium scaling $\propto |\chi| / \mathrm{Im}[\chi]$;
below a threshold size inversely proportional to the index of refraction
(consistent with the half-wavelength resonance condition), the maximum cross
section enhancement possible with dielectrics ($\mathrm{Re}[\chi] > 0$) shows
the same material dependence as Rayleigh scattering. In the limit of a bounding
volume much larger than the wavelength in all dimensions, achievable scattering
interactions asymptote to the geometric area, as predicted by ray optics. For
representative metal and dielectric materials, geometries capable of scattering
power from an incident plane wave within an order of magnitude (typically a
factor of two) of the bound are discovered by inverse design. The basis of the
method rests entirely on scattering theory, and can thus likely be applied to
acoustics, quantum mechanics, and other wave physics.
