  Wave scattering from two-dimensional self-affine Dirichlet and Neumann
surfaces is studied for the purpose of using the intensity scattered from them
to obtain the Hurst exponent and topothesy that characterize the self-affine
roughness. By the use of the Kirchhoff approximation a closed form mathematical
expression for the angular dependence of the mean differential reflection
coefficient is derived under the assumption that the surface is illuminated by
a plane incident wave. It is shown that this quantity can be expressed in terms
of the isotropic, bivariate ($\alpha$-stable) L\'evy distribution of a
stability parameter that is two times the Hurst exponent of the underlying
surface. Features of the expression for the mean differential reflection
coefficient are discussed, and its predictions compare favorably over large
regions of parameter space to results obtained from rigorous computer
simulations based on equations of scattering theory. It is demonstrated how the
Hurst exponent and the topothesy of the self-affine surface can be inferred
from scattering data it produces. Finally several possible scattering
configurations are discussed that allow for an efficient extraction of these
self-affine parameters.
