  Quantum materials are driving a technology revolution in sensing,
communication, and computing, while simultaneously testing many core theories
of the past century. Materials such as topological insulators, complex oxides,
quantum dots, color center hosting semiconductors, and other types of strongly
correlated materials can exhibit exotic properties such as edge conductivity,
multiferroicity, magnetoresistance, single photon emission, and optical-spin
locking. These emergent properties arise and depend strongly on the materials
detailed atomic scale structure, including atomic defects, dopants, and lattice
stacking. In this review, after introduction of different classes of quantum
materials and quantum excitations, we describe how progress in the field of
electron microscopy, including in situ and in operando EM, can accelerate
advances in quantum materials. Our review describes EM methods including: i)
principles and operation modes of EM, ii) EM spectroscopies, such as electron
energy loss spectroscopy, cathodoluminescence, and electron energy gain
spectroscopy, iii) 4D scanning transmission electron microscopy, iv) dynamic
and ultrafast EM, v) complimentary ultrafast spectroscopies, and vi) atomic
electron tomography. We discuss how these methods inform structure function
relations in quantum materials down to the picometer scale and femtosecond time
resolution, and how they enable high resolution manipulation of quantum
materials. Among numerous results, our review highlights how EM has enabled
identification of the 3D structure of quantum defects, measuring reversible and
metastable dynamics of quantum excitations, mapping exciton states and single
photon emission, measuring nanoscale thermal transport and coupled excitation
dynamics, and measuring the internal electric field of quantum
heterointerfaces, all at the quantum materials intrinsic atomic and near
atomic-length scale.
