  We present the detailed study of the temperature dependent dielectric
properties, impedance spectroscopy and electrical conductivity of
LaV$_{1-x}$Nb$_x$O$_4$ ($x=$ 0-1) samples prepared by the solid-state reaction
method. The dielectric constant ($\epsilon_r'$) increases (decreases) with
increase in the temperature (frequency); while, the magnitude of $\epsilon_r'$
remains almost invariant (order of 10$^4$ at 100~Hz and 600\degree C) with $x$.
The single phase $x=$ 0 (monoclinic-monazite, $P2_1/n$) and $x =$ 1 (monoclinic
fergusonite, $I2/a$) samples show the lower values of loss factor [tan$\delta=$
(4-8)] as compared to the $x=$ 0-0.8 samples [tan$\delta=$(12-18)] having mixed
tetragonal and monoclinic phases, which indicates the strong correlation
between the crystal structure and the dielectric properties. The real part of
impedance decreases with both temperature and frequency, and the observed weak
relaxation remains almost unaltered with $x$. The imaginary part of impedance
shows strong relaxation peaks shifting towards higher temperatures with
frequency, which is attributed to the effect of grains, grain boundaries, and
electrodes in the samples. The activation energy of the relaxation process is
estimated to be 0.8-1.0~eV for the $x=$ 0-0.6 samples, and $\approx$1.4~eV for
the $x=$ 0.8; whereas the $x=$ 1 sample shows two values ($\approx$0.5~eV and
$\approx$1.0~eV) in the higher and lower temperature range, respectively.
Further, the change in total conductivity with the angular frequency, which
found to be in the range of 10$^{-3}$ to 10$^{-5}$~S/m, is fitted using the
Jonsher power law. The analysis suggests the OLPT model for all the samples,
whereas the $x$ = 1 sample exhibit a transition near 480\degree C and at higher
temperatures it shows NSPT and QMT. This transition is corroborated by the
tangent loss curves and may be associated with the change in structure.
