  As process technology continues to scale aggressively, circuit aging in a
neuromorphic hardware due to negative bias temperature instability (NBTI) and
time-dependent dielectric breakdown (TDDB) is becoming a critical reliability
issue and is expected to proliferate when using non-volatile memory (NVM) for
synaptic storage. This is because an NVM requires high voltage and current to
access its synaptic weight, which further accelerates the circuit aging in a
neuromorphic hardware. Current methods for qualifying reliability are overly
conservative, since they estimate circuit aging considering worst-case
operating conditions and unnecessarily constrain performance. This paper
proposes RENEU, a reliability-oriented approach to map machine learning
applications to neuromorphic hardware, with the aim of improving system-wide
reliability without compromising key performance metrics such as execution time
of these applications on the hardware. Fundamental to RENEU is a novel
formulation of the aging of CMOS-based circuits in a neuromorphic hardware
considering different failure mechanisms. Using this formulation, RENEU
develops a system-wide reliability model which can be used inside a
design-space exploration framework involving the mapping of neurons and
synapses to the hardware. To this end, RENEU uses an instance of Particle Swarm
Optimization (PSO) to generate mappings that are Pareto-optimal in terms of
performance and reliability. We evaluate RENEU using different machine learning
applications on a state-of-the-art neuromorphic hardware with NVM synapses. Our
results demonstrate an average 38\% reduction in circuit aging, leading to an
average 18% improvement in the lifetime of the hardware compared to current
practices. RENEU only introduces a marginal performance overhead of 5% compared
to a performance-oriented state-of-the-art.
