  After the efficiency of organic photovoltaic (OPV) cells achieved more than
10%, the control of stability and degradation mechanisms of solar cells became
a prominent task. The improvement of device efficiency due to incorporation of
a hole-transport layer (HTL) in bulk-heterojunction solar cells has been
extensively reported. However, the most widely used HTL material, PEDOT:PSS is
frequently suspected to be the dominating source for devices instability under
environmental conditions. Thereby effects like photooxidation and electrode
corrosion are often reported to shorten device lifetime. However, often in
environmental device studies, the source of degradation, whether being from the
HTL, the active layer or the metal cathode are rather difficult to distinguish,
because the external diffusion of oxygen and water affects all components. In
this study, different HTLs, namely prepared from traditional PEDOT:PSS and also
two types of molybdenum trioxide (MoO3), are exposed to different environments
such as oxygen, light or humidity, prior to device finalization under inert
conditions. This allows investigating any effects within the HTL and from
reactions at its interface to the indium-tin-oxide electrode or the active
layer. The surface and bulk chemistry of the exposed HTL has been monitored and
discussed in context to the observed device physics, dynamic charge transport
and spatial performance homogeneity of the according OPV device. The results
show that merely humidity-exposure of the HTL leads to decreased device
performance for PEDOT:PSS, but also for one type of the tested MoO3. The losses
are related to the amount of absorbed water in the HTL, inducing loss of active
area in terms of interfacial contact. The device with PEDOT:PSS HTL after humid
air exposure showed seriously decreased photocurrent by micro-delamination of
swelling/shrinkage of the hygroscopic layer.
