  We present a framework to interpret signal temporal logic (STL) formulas over
discrete-time stochastic processes in terms of the induced risk. Each
realization of a stochastic process either satisfies or violates an STL
formula. In fact, we can assign a robustness value to each realization that
indicates how robustly this realization satisfies an STL formula. We then
define the risk of a stochastic process not satisfying an STL formula robustly,
referred to as the STL robustness risk. In our definition, we permit general
classes of risk measures such as, but not limited to, the conditional
value-at-risk. While in general hard to compute, we propose an approximation of
the STL robustness risk. This approximation has the desirable property of being
an upper bound of the STL robustness risk when the chosen risk measure is
monotone, a property satisfied by most risk measures. Motivated by the interest
in data-driven approaches, we present a sampling-based method for estimating
the approximate STL robustness risk from data for the value-at-risk. While we
consider the value-at-risk, we highlight that such sampling-based methods are
viable for other risk measures.
