  This paper presents a new method to model X-ray scattering on random rough
surfaces. It combines the approaches we presented in two previous papers --
\zs\cite{zhao03} \& \pz\cite{zhao15}. An actual rough surface is (incompletely)
described by its Power Spectral Density (PSD). For a given PSD, model surfaces
with the same roughness as the actual surface are constructed by preserving the
PSD amplitudes and assigning a random phase to each spectral component. Rays
representing the incident wave are reflected from the model surface and
projected onto a flat plane, which is the first order approximation of the
model surface, as outgoing rays and corrected for phase delays. The projected
outgoing rays are then corrected for wave densities and redistributed onto an
uniform grid where the model surface is constructed. The scattering is then
calculated using the Fourier Transform of the resulting distribution. This
method provides the exact solutions for scattering in all directions, without
small angle approximation. It is generally applicable to any wave scatterings
on random rough surfaces and is not limited to small scattering angles.
Examples are given for the Chandra X-ray Observatory optics. This method is
also useful for the future generation X-ray astronomy missions.
