Pattern Recognition Letters - Editorial Board

Editors-in-Chief

M. De Marsico

University of Rome La Sapienza Department of Computer Science, Rome, Italy
Tsinghua University, Beijing, China
University of South Florida, Tampa, United States
Deputy Editor

F. Malmberg

Uppsala University, Uppsala, Sweden
Area Editors

A. S. Chowdhury

Jadavpur University, Electronics and Telecommunication Engineering, Kolkata, India

E.R. Davies

Royal Holloway University of London Department of Physics, Egham, United Kingdom

A. Kumar

The Hong Kong Polytechnic University Faculty of Engineering Department of Computing, Kowloon, Hong Kong

Y. Liu

Edge Hill University Department of Computing, Ormskirk, United Kingdom

E. Michaelsen

Fraunhofer Institute of Optronics System Technologies and Image Exploitation IOSB Ettlingen Branch, Ettlingen, Germany

S. Wang

University of South Carolina College of Engineering and Computing, Columbia, South Carolina, United States
Associate Editors

A. F. Abate

University of Salerno, Fisciano, Italy

F. Alonso-Fernandez

Halmstad University, Halmstad, Sweden
University of Groningen, Bernoulli Institute for Mathematics, Computer Science and Artificial Intelligence, Groningen, Netherlands
L. Baraldi University of Modena and Reggio Emilia Department of Engineering Enzo Ferrari, Modena, Italy

E. Benetos

Queen Mary University of London, London, United Kingdom

S. Biswas

Indian Institute of Science, Bengaluru, India

M. Castrillon Santana

University of Las Palmas de Gran Canaria School of Engineering, Las Palmas de Gran Canaria, Spain

S. Chen

Nanjing University of Aeronautics and Astronautics, Nanjing, China
Graduate School of Information and Communications Science and Technology, Noisy le Grand, France
University of Verona Department of Computer Science, Verona, Italy
R. Da Silva Torres Norwegian University of Science and Technology, Trondheim, Norway
University of Cassino and Southern Lazio, Cassino, Italy

D. Dembélé

Institut of Genetics and Molecular and Cellular Biology, Illkirch Graffenstaden, France
C. Deng Xidian University School of Mechano-Electronic Engineering, Xian, China

S. Dutta Roy

Indian Institute of Technology Delhi, New Delhi, India

A. Fernández-Caballero

University of Castilla-La Mancha Albacete Research Institute of Informatics, Albacete, Spain

L. Gallo

National Research Council, Roma, Italy

J. Han

Northwestern Polytechnical University, Xian, China

L. Heutte

University of Rouen Laboratory of Computer Science Information Processing and Systems, Saint-Etienne-du-Rouvray, France
Ningbo University, Ningbo, China

L. Jin

South China University of Technology, Guangzhou, China
Gaspard-Monge Computer Science Laboratory, Marne La Vallee, France
University of Oulu, Oulu, Finland
X. Liu

X. Liu

Michigan State University, East Lansing, Michigan, United States
B. Luo

B. Luo

Anhui University, Hefei, China

A. Marcelli

University of Salerno, Fisciano, Italy
Indian Institute of Technology Kharagpur, Kharagpur, India
University of Salerno, Fisciano, Italy

U. Pal

Indian Statistical Institute Computer Vision and Pattern Recognition Unit, Kolkata, India

N. Passat

Reims Champagne-Ardenne University, Reims, France

Y. Peng

Peking University, Beijing, China

X. Qian

Texas A&M University College Station, College Station, Texas, United States

D. Riccio

University of Naples Federico II Department of Electrical Engineering and Information Technology, Napoli, Italy
University of Naples Federico II Department of Electrical Engineering and Information Technology, Napoli, Italy

J. Ruiz-Shulcloper

Advanced Technologies Application Centre, La Habana, Cuba

P.K. Saha

The University of Iowa, Iowa City, Iowa, United States
Chinese Academy of Sciences, Beijing, China

A. Shokoufandeh

Drexel University College of Computer and Informatics, Philadelphia, Pennsylvania, United States
University of Twente, Enschede, Netherlands
J. Su Harbin Institute of Technology Shenzhen School of Computer Science and Technology, Shenzhen, China
A. C. Telea Utrecht University, Utrecht, Netherlands

K.A. Toh

Yonsei University, Seoul, Korea, Republic of

A. Torsello

Ca' Foscari University Department of Environmental Sciences Informatics and Statistics, Venezia, Italy

F. Tortorella

University of Salerno, Fisciano, Italy

H. Yan

Beijing University of Posts and Telecommunications, Beijing, China

J. Yang

Nanjing University of Science and Technology, Nanjing, China

L. Yin

Binghamton University, Binghamton, New York, United States
Shandong University, Jinan, China

J. Zou

National Library of Medicine, Bethesda, Maryland, United States
Advisory Editors

S. Dickinson

University of Toronto, Toronto, Ontario, Canada

R.P.W. Duin

TU Delft, Delft, Netherlands

J.V. Kittler

University of Surrey, Guildford, United Kingdom

W.G. Kropatsch

TU Wien University, Wien, Austria

Mark S. Nixon

University of Southampton, Southampton, United Kingdom

T. Tan

Chinese Academy of Science National Laboratory of Pattern Recognition, Beijing, China
Founding Editors

E. Backer

E.S. Gelsema

Editors Emeriti

G. Borgefors

Uppsala University, Uppsala, Sweden

T.K. Ho

Nokia Bell Labs, Murray Hill, New Jersey, United States

G. Sanniti di Baja

Institute for High Performance Computing and Networking National Research Council, Rende, Italy
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