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Ahn, Charles H.National Library of the Netherlands-testNUKAT Center (Poland)SUDOC (France)Library of Congress/NACO

Ahn, CharlesRERO (Switzerland)

VIAF ID: 63536998 (Personal)

Permalink: http://viaf.org/viaf/63536998

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  • National Library of the Netherlands-test
    Internal VIAF record
    100 1 _ ‎‡a  Ahn, Charles H.
  • Library of Congress/NACO
    Internal VIAF record
    100 1 _ ‎‡a  Ahn, Charles H.
  • NUKAT Center (Poland)
    Internal VIAF record
    100 1 _ ‎‡a  Ahn, Charles H.
  • SUDOC (France)
    Internal VIAF record
    100 1 _ ‎‡a  Ahn, Charles H.
  • RERO (Switzerland)
    Internal VIAF record
    100 1 _ ‎‡a  Ahn, Charles

 

 

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  1. Physics of ferroelectrics : ‎(6) National Library of the Netherlands-testNUKAT Center (Poland)RERO (Switzerland)Library of Congress/NACO
  2. Writing electronic nanofeatures in epitaxial oxide heterostructures ‎(1) RERO (Switzerland)
  3. Scanning probe microscopy for the imaging and control of ferroelectric oxides ‎(1) RERO (Switzerland)
  4. Physics of ferroelectrics : a modern perspective ‎(1) NUKAT Center (Poland)
  5. Nonvolatile, reversible writing of electronic nanostructures in epitaxial ferroelectric/metallic oxide heterostructures using a field effect ‎(1) RERO (Switzerland)
  6. Nanometer control of the ferroelectric polarization in Pb(Zr₀̣Ti₀̣)O₃ thin films ‎(1) RERO (Switzerland)
  7. Modern Ferroelectrics ‎(1) SUDOC (France)
  8. Local, nonvolatile electronic writing of epitaxial Pb(Zr₀.₅₂Ti₀.₄₈)O₃/SrRuO₃ heterostructures ‎(1) RERO (Switzerland)
  9. Ferroelectricity in thin perovskite films ‎(1) RERO (Switzerland)
  10. Ferroelectric field effect in ultrathin SrRuO₃ films ‎(1) RERO (Switzerland)

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Open SectionClose Section History of VIAF ID:63536998 (7)
http://viaf.org/viaf/63536998/
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