0787965065

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ISBN-10/ISBN-13:
0819422789 / 978-0819422781 / Microlithography and Metrology in Micromachining II: 14-15 October, 1996, Austin, Texas (Proceedings / Spie--The International Society of Optical Eng) /
0819422835 / 978-0819422835 / Selected Papers on Laser Beam Diagnostics (S P I E Milestone Series) /
0819423009 / 978-0819423009 / Automated Optical Inspection for Industry: 6-7 November 1996, Beijing, China (Proceedings / Spie--The International Society for Optical En) /
0819423106 / 978-0819423108 / Machine Vision Applications, Architectures, and Systems Integration V: 18-19 November 1996, Boston, Massachusetts (Machine Vision Applications, Architectures & Systems Integra) /
0819423149 / 978-0819423146 / Open Architecture Control Systems and Standards: 20-21 November, 1996, Boston, Massachusetts (Spie Proceedings Series) /
0819423203 / 978-0819423207 / Emerging Components and Technologies for All-Optical Photonic Systems II: 18-19 November, 1996, Boston, Massachusetts (Proceedings / Spie--The International Society for Optical En) /
0819423521 / 978-0819423528 / Nondestructive Evaluation for Process Control in Manufacturing (Proceedings / Spie--The International Society for Optical En) /
0819423548 / 978-0819423542 / Advanced Focal Plane Arrays and Electronic Cameras: 9-10 October 1996, Berlin, Frg (Advanced Focal Plane Arrays & Electronic Cameras) /
0819423734 / 978-0819423733 / Optical Inorganic Dielectric Materials and Devices: 26-29 August, 1996, Riga, Latvia (Proceedings / Spie--The International Society for Optical En) /
0819423785 / 978-0819423788 / Handbook of Microlithography, Micromachining, and Microfabrication. Volume 1: Microlithography (SPIE Press Monograph Vol. PM39) /
0819424056 / 978-0819424051 / Physics and Simulation of Optoelectronic Devices V (Physics & Simulation of Optoelectronic Devices V) /
0819421936 / 978-0819421937 / Multilayer and Grazing Incidence X-Ray/Euv Optics III: 5-6 August, 1996, Denver, Colorado (Proceedings / Spie--The International Society for Optical En) /
0819421944 / 978-0819421944 / Gamma-Ray and Cosmic-Ray Detectors, Techniques, and Missions: 5-7 August 1996, Denver, Colorado (SPIE Proceedings) /
0819421987 / 978-0819421982 / Space Sciencecraft Control and Tracking in the New Millennium: 6-8 August 1996, Denver, Colorado (SPIE Proceedings) /
0819421995 / 978-0819421999 / Photonics for Space Environments IV /
0819422029 / 978-0819422026 / Cryogenic Optical Systems and Instruments VII: 8-9 August 1996, Denver, Colorado (Cryogenic Optical Systems & Instruments VII) /
0819422320 / 978-0819422323 / Photonics and Radio Frequency: 7-8 August 1996, Denver, Colorado (Proceedings / Spie--The International Society for Optical En) /
081942269X / 978-0819422699 / Selected Papers on Silica Integrated Optical Circuits (S P I E Milestone Series) /
0819422754 / 978-0819422750 / Optical Characterization Techniques for High-Performance Microelectronic Device Manufacturing III: 16-17 October 1996, Austin, Texas /
0819422959 / 978-0819422958 / Detectors, Focal Plane Arrays, and Applications: 4-5 November 1996, Beijing, China (Proceedings / Spie--The International Society for Optical En) /
0819423181 / 978-0819423184 / Multimedia Storage and Archiving Systems: 18-19 November 1996, Boston, Massachusetts (Pproceedings / Spie--The International Society for Optical E) /
0819423211 / 978-0819423214 / All-Optical Communication Systems: Architecture, Control, and Network Issues II: 20-21 November, 1996, Boston, Massachusetts (Proceedings / Spie--The International Society for Optical En) /
0819423432 / 978-0819423436 / Forensic Evidence Analysis and Crime Scene Investigation: 20-21 November 1996 Boston, Massachusetts (Proceedings / SPIE--the International Society for Optical Engineering) /
081942353X / 978-0819423535 / Imaging Sciences and Display Technologies: 7-10 October, 1996, Berlin, Frg (Imaging Sciences & Display Technologies) /
0819424161 / 978-0819424167 / Optoelectronic Interconnects and Packaging IV: 12-14 February, 1997, San Jose, California (Proceedings of Spie--The International Society for Optical E) /
0819424196 / 978-0819424198 / Miniaturized Systems with Micro-Optics and Micromechanics II: 10-12 February 1997, San Jose, California (SPIE Proceedings) /
0819424242 / 978-0819424242 / Projection Displays III: 10-12 February 1997, San Jose, California (Spie Proceedings Series) /
0819424404 / 978-0819424402 / Machine Vision Applications in Industrial Inspection V: 10-11 February, 1997, San Jose, California (Proceedings of Spie) /
0819424587 / 978-0819424587 / Smart Structures and Materials, 1997 (Spie Proceedings Series) /
0819424617 / 978-0819424617 / Rotating Mirror Streak and Framing Cameras / Eugene A. Igel, Magne Kristiansen


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