Instruct: Identify the main and secondary category of Arxiv papers based on the titles and abstracts
Query: Statistical Yield Modeling for IC Manufacture: Hierarchical Fault
  Distributions   A hierarchical approach to the construction of compound distributions for
process-induced faults in IC manufacture is proposed. Within this framework,
the negative binomial distribution and the compound binomial distribution are
treated as level-1 models. The hierarchical approach to fault distribution
offers an integrated picture of how fault density varies from region to region
within a wafer, from wafer to wafer within a batch, and so on. A theory of
compound-distribution hierarchies is developed by means of generating
functions. With respect to applications, hierarchies of yield means and yield
probability-density functions are considered and an in-process measure of yield
loss is introduced. It is shown that the hierarchical approach naturally
embraces the Bayesian approach.

18
The categories of this paper are: econ
14
The categories of this paper are: math-ph
8
The categories of this paper are: hep-ex
6
The categories of this paper are: astro-ph
11
The categories of this paper are: hep-lat
22
The categories of this paper are: chao-dyn
29
The categories of this paper are: funct-an
5
The categories of this paper are: gr-qc
32
The categories of this paper are: atom-ph
1
The categories of this paper are: cs
21
The categories of this paper are: adap-org
27
The categories of this paper are: comp-gas
20
The categories of this paper are: acc-phys
0
The categories of this paper are: hep-ph
23
The categories of this paper are: solv-int
25
The categories of this paper are: patt-sol