Instruct: Identify the main and secondary category of Arxiv papers based on the titles and abstracts
Query: Defect detection in nano-scale transistors based on radio-frequency
  reflectometry   Radio-frequency reflectometry in silicon single-electron transistors (SETs)
is presented. At low temperatures (<4 K), in addition to the expected Coulomb
blockade features associated with charging of the SET dot, quasi-periodic
oscillations are observed that persist in the fully depleted regime where the
SET dot is completely empty. A model, confirmed by simulations, indicates that
these oscillations originate from charging of an unintended floating gate
located in the heavily doped polycrystalline silicon gate stack. The technique
used in this experiment can be applied for detailed spectroscopy of various
charge defects in nanoscale SETs and field effect transistors

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The categories of this paper are: q-alg
5
The categories of this paper are: gr-qc
32
The categories of this paper are: atom-ph
10
The categories of this paper are: q-bio
0
The categories of this paper are: hep-ph
1
The categories of this paper are: cs
11
The categories of this paper are: hep-lat
31
The categories of this paper are: ao-sci
3
The categories of this paper are: physics
20
The categories of this paper are: acc-phys
16
The categories of this paper are: stat
26
The categories of this paper are: bayes-an
23
The categories of this paper are: solv-int
9
The categories of this paper are: nlin
17
The categories of this paper are: q-fin
35
The categories of this paper are: mtrl-th