Instruct: Identify the main and secondary category of Arxiv papers based on the titles and abstracts
Query: EffiTest: Efficient Delay Test and Statistical Prediction for
  Configuring Post-silicon Tunable Buffers   At nanometer manufacturing technology nodes, process variations significantly
affect circuit performance. To combat them, post- silicon clock tuning buffers
can be deployed to balance timing bud- gets of critical paths for each
individual chip after manufacturing. The challenge of this method is that path
delays should be mea- sured for each chip to configure the tuning buffers
properly. Current methods for this delay measurement rely on path-wise
frequency stepping. This strategy, however, requires too much time from ex-
pensive testers. In this paper, we propose an efficient delay test framework
(EffiTest) to solve the post-silicon testing problem by aligning path delays
using the already-existing tuning buffers in the circuit. In addition, we only
test representative paths and the delays of other paths are estimated by
statistical delay prediction. Exper- imental results demonstrate that the
proposed method can reduce the number of frequency stepping iterations by more
than 94% with only a slight yield loss.

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The categories of this paper are: eess
10
The categories of this paper are: q-bio
7
The categories of this paper are: hep-th
32
The categories of this paper are: atom-ph
35
The categories of this paper are: mtrl-th
36
The categories of this paper are: cmp-lg
9
The categories of this paper are: nlin
2
The categories of this paper are: math
14
The categories of this paper are: math-ph
31
The categories of this paper are: ao-sci
13
The categories of this paper are: quant-ph
23
The categories of this paper are: solv-int
26
The categories of this paper are: bayes-an
3
The categories of this paper are: physics
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The categories of this paper are: funct-an
34
The categories of this paper are: chem-ph