ABOUT DMPI
FAQs
ABOUT DMP
Dominion MicroProbes Inc. (DMPI) designs and manufactures millimeter and sub-millimeter wavelength on-wafer ground-signal ground probes and associated components for electrical measurement of devices and materials.. DMPI is the sole manufacture of the T-Wave probe line. The T-Wave probe line is distributed exclusively by Cascade Microtech. Please contact
Cascade Microtech Inc
. to learn more about
purchase
and
repair
of T-Wave probes.
OUR TECHNOLOGY
While significant progress has been made in mm and submm wavelength circuit design and fabrication, the measurement infrastructure for characterizing such components remains largely undeveloped. Often testing requires dicing and mounting of individual devices to a fixture for measurement. Robust and calibrated on-wafer measurements significantly reduce the effort required to characterize a wafer of devices while increasing the accuracy of the measurement by eliminating errors and effects associated with fixtures. We have developed a scalable approach for the manufacture of microfabricated probes with low-insertion loss coupling to the DUT and DC biasing of probed circuits. The Si probe chip is mounted in a waveguide split block allowing for drop-in replacement of the probe chip without needing replacement of the entire block module. Our approach is scalable to well beyond 1THz and we have demonstrated wafer probes from WR5.1 [140-220 GHz] to WR1.0 [750-1100 GHz] with excellent results.
OUR HISTORY
H
DMPI was founded in 2011 by professors Scott Barker (CEO), Arthur Lichtenberger (President and COO) and Robert Weikle (CTO) from the University of Virginia. Matt Bauwens (Senior Engineer) joined DMPI in 2013.
COLLABORATIONS
DMPI welcomes collaborations with other companies and research groups. In May of 2014, DMPI became the first
MeasureOne
partner with Cascase Microtech, Inc. DMPI and the founders also have a long history of collaboration with Virginia Diodes- both companies were spun out of the same University of Virginia Microfabrication Laboratory. DMPI is also currently in collaboration with Lakeshore Cryotonics, Swissto12, Virginia Diodes and the University of Virginia for the development of a THz cryogenic on wafer probing tool.
WAFER PROBE PUBLICATIONS
A 1.1 THz Micromachined On-Wafer Probe
PDF
Characterization of Micromachined On-Wafer Probes for the 600 – 900 GHz Waveguide Band
PDF
Improved Micromachined Terahertz On-Wafer Probe Using Integrated Strain Sensor
Measurement Uncertainty Characterization of Terahertz Large Wafer Probing
A W-band Balun Integrated Probe with Common Mode Matching Network
Micromachining of Submillimeter-Wave Calibration Standards
Characterization of submillimeter-wave Schottky diodes in the 500–750 GHz band using micromachined on-wafer probes
Micromachined probes for on-wafer measurement of millimeter- and submillimeter-wave devices and components
An Experimental Technique for Calibration Uncertainty Analysis
Integrated strain sensor for micromachined terahertz on-wafer probe
Improved Micromachined Terahertz On-Wafer Probe Using Integrated Strain Sensor
A Terahertz Micromachined On-Wafer Probe for WR-1.2 Waveguide
PDF
Terahertz Micromachined On-Wafer Probes: Repeatability and Reliability
Micromachined probes for on-wafer characterization of terahertz and submillimeter-wave components
A Micromachined Terahertz Waveguide 90 degree Twist
Micromachined Probes for Submillimeter-Wave On-Wafer Measurements—Part I: Mechanical Design and Characterization
Micromachined Probes for Submillimeter-Wave On-Wafer Measurements—Part II: RF Design and Characterization
Terahertz micromachined on-wafer probes: Repeatability and robustness
Calibration accuracy of a 625 GHz on-wafer probe
Micromachined on-wafer probes
DMPI@dmprobes.com